| 000 | 00638cam a22002414a 4500 | ||
|---|---|---|---|
| 003 | AR-SsjUIB | ||
| 005 | 20250710162821.0 | ||
| 008 | 250429s1978 xxu 000 0 eng d | ||
| 020 | _a0471030945 | ||
| 040 |
_aAR-SsjUIB _cAR-SsjUIB |
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| 041 | 0 | _aeng | |
| 044 | _axxu | ||
| 080 | _a543.4 | ||
| 100 | 1 |
_aSandell, Ernest Birger _917930 |
|
| 245 | 1 | 0 |
_aPhotometric determination of traces of metals : _bgeneral aspect. |
| 260 |
_aNew York : _bJohn Wiley, _c1978. |
||
| 300 | _a1085 p. | ||
| 650 | 7 |
_aFotometrÃa _2lemb _93412 |
|
| 655 | 7 |
_aLibro _2unescot _914 |
|
| 942 |
_cLB _2cdu |
||
| 945 |
_adbfi _d2002-10-17 |
||
| 999 |
_c14144 _d14144 |
||