000 00608cam a22002294a 4500
003 AR-SsjUIB
005 20250710145534.0
008 250429s1967 xxk 000 0 eng d
040 _aAR-SsjUIB
_cAR-SsjUIB
041 0 _aeng
044 _axxk
080 _a548
100 1 _aAuleytner, J.
_912899
245 1 0 _aX-ray methods in the study defects in single crystals.
260 _aOxford :
_bPergamon Press,
_c1967.
650 7 _aCristalografĂ­a
_2lemb
_93748
650 7 _aRayos x
_2lemb
_93556
655 7 _aLibro
_2unescot
_914
942 _cLB
_2cdu
945 _adbfi
_d1999-10-18
999 _c11474
_d11474