Sandell, Ernest Birger <br/><br/>
Photometric determination of traces of metals :  general aspect. 

 - New York :  John Wiley,  1978. 
 - 1085 p. 
<br/><br/><label>ISBN: </label>0471030945 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Fotometría
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Libro
<br/><br/><label>Universal Decimal Class. No.: </label>543.4